Sawing & polishing unit for Crimp Cross Section Analysis
The SPU 6 Saw & Polishing Unit is a component of the MicroGraph System for the creation of high quality cross-sectional images of crimp connections and others.
The Schleuniger SIS 6 is an extremely compact device for crimp cross section analysis. It’s the only one of its kind that combines three different highlights:
Within a few quick steps, users can create cross-sectioned samples. The individual sample is placed in the holder and aligned with the saw blade. The unique blade provides a cut that does not require polishing after the sample is cut. After cutting, the sample holder is quickly moved from the blade to the microscope with the use of guide rails. The sample holder rotates 90º allowing a perfect view of the cross sectioned sample.
All parameters of cross sectioned contacts can be measured and analyzed with the CrimpLab 2 analysis software. Measurements are performed manually when using the CrimpLab 2 Standard software. The job management feature allows all measurement parameters to be stored for easy recall and test accuracy. The optional CrimpLab 2 Automatic software includes fully automatic contour recognition and measurement of B-crimps. All measurement parameters can be captured in seconds with just a few clicks. Processing steps and motions have been minimized to provide the fastest results.
Sawing & polishing unit for Crimp Cross Section Analysis
The SPU 60 Saw & Polishing Unit is a component of the MicroGraph System for the creation of high quality cross-sectional images of crimp connections and others.
Sample inspection system for Crimp Cross Section Analysis
The MZU 1.3 MacroZoom Unit is a component of the MicroGraph System for the creation of high quality cross-sectional images of crimp connections and other applications. The MZU 1.3 includes the microscope unit plus the analysis software. It features 9 incremental zoom steps that can be individually calibrated for accurate measurements. The 1.3 Megapixel camera provides high quality images and lighting can be adjusted either mechanically on the LED ring light or by the software. A wide lens coverage (field of view) makes this unit well suited to handle a variety of applications.
Sample staining unit for Crimp Cross Section Analysis
The ESU 6 ElectrolyteStaining Unit is a component of the MicroGraph System for the creation of high quality cross-sectional images of crimp connections and other applications.
The ESU 6 utilizes a staining solution with Ph level of 7, which is equal to water. Therefore, the staining process is simple and fast yet much safer than conventional systems that utilize acid solutions to etch the face of the sample.
The ESU 6 can be purchased as a component of the complete MicroGraph System or purchased individually.
Modular System for Crimp Cross Section Analysis
Crimp cross sectional analysis has quickly become an integral part of the crimp quality process. With the MicroGraph System (MGS), crimp cross-sectional images can created in a fraction of the time compared to conventional methods.
The combined sawing-polishing process, innovative electrolyte staining process, and high precision optics result in high quality images for thorough analysis of the connection. The carbide metal saw blade cuts so cleanly that polishing is most often not required.
Schleuniger’s MicroGraph System (MGS) is a complete system for making cross sectional analysis for a variety of different products. The MGS includes a SawPolish Unit (SPU), an ElectrolyteStaining Unit (ESU 6) and a MacroZoom Unit (MZU 1.3) with analysis software. Depending on the size and range of samples to be analyzed, systems can include larger or smaller SPU devices. The MGS 6 includes the SPU 6 for processing samples up to 6 mm2 (10AWG). The MGS 60 includes the SPU 60 up to 60 mm2 (1/0 AWG).
Optional, ergonomically designed work tables or mobile carts are available depending on the desired work process and space requirements. Options and accessories for the individual components can be found on the corresponding component pages.
| |
 |
